Research on the Circuit Board Copying and Development of X-ray DiffractometersX
Ray diffraction machine is mainly used in powder, block or film sample phase qualitative, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic stress or microscopic stress determination, grain size determination, crystallinity determination, etc.
In addition to the conventional diffraction data scanning mode, the X-ray diffractometer can also support the transmission data scanning mode. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structure analysis. The diffraction signal is strong, which is more suitable for routine laboratory phase identification. In addition, in the transmission mode, the powder sample can be in trace, suitable for data acquisition with relatively small sample size and does not meet the requirements of sample preparation in diffraction mode.
查看更多